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Proceedings Paper

Extreme ultraviolet marking system for anti-counterfeiting tags with adjustable security level
Author(s): P. Di Lazzaro; S. Bollanti; F. Flora; L. Mezi; D. Murra; A. Torre; F. Bonfigli; R. M. Montereali; M. A. Vincenti
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Paper Abstract

We present a recently patented apparatus which consists of an extreme ultraviolet radiation source writing invisible patterns on thin tags of alkali halides. The tags patterned using this method are almost impossible to counterfeit, and offer a much better protection against fakes than available anti-counterfeiting techniques. We will discuss if this novel technology is ready for industrial production of anti-counterfeiting tags.

Paper Details

Date Published: 30 January 2013
PDF: 7 pages
Proc. SPIE 8677, XIX International Symposium on High-Power Laser Systems and Applications 2012, 86770T (30 January 2013); doi: 10.1117/12.2010400
Show Author Affiliations
P. Di Lazzaro, ENEA (Italy)
S. Bollanti, ENEA (Italy)
F. Flora, ENEA (Italy)
L. Mezi, ENEA (Italy)
D. Murra, ENEA (Italy)
A. Torre, ENEA (Italy)
F. Bonfigli, ENEA (Italy)
R. M. Montereali, ENEA (Italy)
M. A. Vincenti, ENEA (Italy)


Published in SPIE Proceedings Vol. 8677:
XIX International Symposium on High-Power Laser Systems and Applications 2012
Kerim R. Allakhverdiev, Editor(s)

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