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Proceedings Paper

Several examples of using contact profilometer for optical surface mapping
Author(s): M. Havelková; H. Hiklová
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Paper Abstract

The number of devices and methods for non-contact solid surface measurement and mapping is growing. Nevertheless contact devices still have value in measuring roughness, waviness and shape measurement. Modern contact devices measure without any negative influence to the surface and are even used for optical and other sensitive surfaces. Some examples are mentioned in the article below.

Paper Details

Date Published: 18 December 2012
PDF: 7 pages
Proc. SPIE 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 86972G (18 December 2012); doi: 10.1117/12.2010362
Show Author Affiliations
M. Havelková, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
H. Hiklová, Joint Lab. of Optics of Palacky Univ. and Institute of Physics of the ASCR, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 8697:
18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Jan Peřina; Libor Nozka; Miroslav Hrabovský; Dagmar Senderáková; Waclaw Urbańczyk; Ondrej Haderka; Libor Nožka, Editor(s)

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