Share Email Print
cover

Proceedings Paper

Displacement measurement with over-determined interferometer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a concept combining traditional displacement incremental interferometry with a tracking refractometer following the fluctuations of the refractive index of air. This concept is represented by an interferometric system of three Michelson-type interferometers where two are arranged in a counter-measuring configuration and the third one is set to measure the changes of the fixed length, here the measuring range of the overall displacement. In this configuration the two counter-measuring interferometers have identical beam paths with proportional parts of the overall one. The fixed interferometer with its geometrical length of the measuring beam linked to a mechanical reference made of a high thermal-stability material (Zerodur) operates as a tracking refractometer monitoring the atmospheric refractive index directly in the beam path of the displacement measuring interferometers. This principle has been demonstrated experimentally through a set of measurements in a temperature controlled environment under slowly changing refractive index of air in comparison with its indirect measurement through Edlen formula. With locking of the laser optical frequency to fixed value of the overall optical length the concept can operate as an interferometric system with compensation of the fluctuations of the refractive index of air.

Paper Details

Date Published: 18 December 2012
PDF: 7 pages
Proc. SPIE 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 86970E (18 December 2012); doi: 10.1117/12.2010249
Show Author Affiliations
Josef Lazar, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Miroslava Holá, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Jan Hrabina, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Zdeněk Buchta, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Ondřej Číp, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Jindřich Oulehla, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 8697:
18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Jan Peřina; Libor Nozka; Miroslav Hrabovský; Dagmar Senderáková; Waclaw Urbańczyk; Ondrej Haderka; Libor Nožka, Editor(s)

© SPIE. Terms of Use
Back to Top