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Proceedings Paper

Pile-irradiation-induced photoluminescence in vitreous silica
Author(s): Shouichi Nasu; Sokumi Oonishi; Hidehito Nanto; Ryoichi Yamamoto; Takaaki Tanifuji; Tetsuya Nakazawa; Kenji Noda; Takaumi Kimura; Zenko Yoshida; Yoshiharu Kato; Tatsushi Igarashi; Yukihiro Morimoto; Takeo Matsushima; Takao Toyomane
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Paper Abstract

Commercially available vitreous silica, Suprasil P-20 and GE-124, were irradiated in JRR-2 to the total fast neutron fluences of 2.6 X 1017 nvt. Ultraviolet optical absorption, photoluminescence (PL), PL excitation and infrared absorption were measured at room temperature. Three PL peaks at 4.3 eV, 2.7 eV and 2.2 eV were clearly observed for pile irradiated specimens excited by 254 nm (4.88 eV) light, in addition to the intrinsic PL. A 1.9 eV PL was observed in the time resolved PL experiment for pile-irradiated specimens excited by fourth harmonic Nd:YAG laser light of 5 mJ/cm2 pulse. Fourier transform infrared attenuated total reflection measurement showed no bond angle changes in Si-O-Si bridging angle.

Paper Details

Date Published: 9 February 1995
PDF: 10 pages
Proc. SPIE 2362, International Conference on Excitonic Processes in Condensed Matter, (9 February 1995); doi: 10.1117/12.200980
Show Author Affiliations
Shouichi Nasu, Kanazawa Institute of Technology (Japan)
Sokumi Oonishi, Kanazawa Institute of Technology (Japan)
Hidehito Nanto, Kanazawa Institute of Technology (Japan)
Ryoichi Yamamoto, Kanazawa Institute of Technology (Japan)
Takaaki Tanifuji, Japan Atomic Energy Research Institute (Japan)
Tetsuya Nakazawa, Japan Atomic Energy Research Institute (Japan)
Kenji Noda, Japan Atomic Energy Research Institute (Japan)
Takaumi Kimura, Japan Atomic Energy Research Institute (Japan)
Zenko Yoshida, Japan Atomic Energy Research Institute (Japan)
Yoshiharu Kato, Japan Atomic Energy Research Institute (Japan)
Tatsushi Igarashi, USHIO Inc. (Japan)
Yukihiro Morimoto, USHIO Inc. (Japan)
Takeo Matsushima, USHIO Inc. (Japan)
Takao Toyomane, USHIO Inc. (Japan)


Published in SPIE Proceedings Vol. 2362:
International Conference on Excitonic Processes in Condensed Matter

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