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Proceedings Paper

Fault detection in word-level nanoICs using vector Boolean derivatives
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Paper Abstract

This paper consists of four parts: (1) The word-level representations of digital circuits which included (a) word-level arithmetic representation, (b) word-level sum-of-products representation, and (c) word-level Reed-Muller representation. (2) The three word-level nano ICs circuit designs. (3) The introduction of the vector Boolean derivative. (4) The fault detection in word-level digital circuits using the vector Boolean derivative. The formulas for deriving tests for detecting stuck-at-0 (s-a-0) and stuck-at-1(s-a-1) are given word-level digital circuit presented in in any of the three representations.

Paper Details

Date Published: 9 April 2013
PDF: 4 pages
Proc. SPIE 8691, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2013, 86910E (9 April 2013); doi: 10.1117/12.2009527
Show Author Affiliations
Samuel C. Lee, Univ. of Oklahoma (United States)
Fadhil Aula, Univ. of Oklahoma (United States)


Published in SPIE Proceedings Vol. 8691:
Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2013
Vijay K. Varadan, Editor(s)

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