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Proceedings Paper

GaSe damage threshold under IR pulse pumping
Author(s): Jin Guo; Ji-Jiang Xie; Laiming Zhang; Fei Chen; Ke Jiang; Sergei V. Alexeev; Yury M. Andreev; Konstantin A. Kokh; Gregory V. Lanskii; Valery F. Losev; Dmitry M. Lubenko; Anna V. Shaiduko; Valeriy A. Svetlichnyi
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Paper Abstract

Damage threshold of non-linear GaSe crystals under IR fs (Ti:Sapphiere 800 nm laser and 1.1-2.9μm OPG) and ns (2. 79 Er3+:YSGG and 10.6μm CO2 laser) pulse pumping is studded in details. Local micro defects and field induced effects (GaSe dissociation, multiphoton absorptions and transient transparency origin effects) are identified as responsible for damage threshold in this case. Local (including nano scaled) defects and thermal effects are identified as reason of damage threshold under ns pulse pumping.

Paper Details

Date Published: 30 January 2013
PDF: 8 pages
Proc. SPIE 8677, XIX International Symposium on High-Power Laser Systems and Applications 2012, 86771E (30 January 2013); doi: 10.1117/12.2008916
Show Author Affiliations
Jin Guo, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Ji-Jiang Xie, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Laiming Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Fei Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Ke Jiang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Sergei V. Alexeev, High Current Electronic Institute (Russian Federation)
Yury M. Andreev, Institute for Monitoring of Climatic and Ecological Systems (Russian Federation)
Konstantin A. Kokh, Institute of Geology and Mineralogy (Russian Federation)
Gregory V. Lanskii, High Current Electronic Institute (Russian Federation)
Valery F. Losev, Institute of High Current Electronics (Russian Federation)
Tomsk Polytechnic Univ. (Russian Federation)
Dmitry M. Lubenko, High Current Electronic Institute (Russian Federation)
Anna V. Shaiduko, Institute of Monitoring of Climatic and Ecological Systems (Russian Federation)
Valeriy A. Svetlichnyi, Tomsk Polytechnic Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 8677:
XIX International Symposium on High-Power Laser Systems and Applications 2012
Kerim R. Allakhverdiev, Editor(s)

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