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Proceedings Paper

A novel temperature-strain decoupling method for distributed fiber sensing system based on backscattered light
Author(s): Tianying Chang; David Y. Li; Yu Zhao; Ruijuan Yang; Yongliang Wang; Jin Zhang; Hong-Liang Cui
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Paper Abstract

A novel decoupling method is proposed to tackle the temperature-strain decoupling issue conveniently and economically for distributed fiber temperature and strain sensing systems (DTSS). Because Rayleigh backscattered light is not sensitive to either temperature or strain, a faction of it is taken as a reference light to eliminate the influence from emitting light caused instability and to ameliorate interference factors such as light path’s disturbance in the system. On the other hand, using a RF frequency filter, we were able to distinguish factors from Brillouin backscattered light intensity or its frequency shift on the heterodyne signal. In this paper, the working principles and related experiment results are presented. After calibration, the length of the sensing fiber is 13 km and the spatial resolution is 7 m. Other parameters are anticipated as temperature resolution 1°C, and strain resolution 20 εμ in this system.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84181E (15 October 2012); doi: 10.1117/12.2008760
Show Author Affiliations
Tianying Chang, Jilin Univ. (China)
Polytechnic Institute of New York Univ. (United States)
David Y. Li, L.C. Pegasus Corp. (United States)
Yu Zhao, Jilin Univ. (China)
Ruijuan Yang, Jilin Univ. (China)
Yongliang Wang, Jilin Univ. (China)
Jin Zhang, Jilin Univ. (China)
Hong-Liang Cui, Jilin Univ. (China)
Polytechnic Institute of New York Univ. (United States)


Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Xiangang Luo; Xiaoyi Bao; Song Hu; Yanqiu Li, Editor(s)

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