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Proceedings Paper

Figure of merit for macrouniformity based on image quality ruler evaluation and machine learning framework
Author(s): Weibao Wang; Gary Overall; Travis Riggs; Rebecca Silveston-Keith; Julie Whitney; George Chiu; Jan P. Allebach
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Paper Abstract

Assessment of macro-uniformity is a capability that is important for the development and manufacture of printer products. Our goal is to develop a metric that will predict macro-uniformity, as judged by human subjects, by scanning and analyzing printed pages. We consider two different machine learning frameworks for the metric: linear regression and the support vector machine. We have implemented the image quality ruler, based on the recommendations of the INCITS W1.1 macro-uniformity team. Using 12 subjects at Purdue University and 20 subjects at Lexmark, evenly balanced with respect to gender, we conducted subjective evaluations with a set of 35 uniform b/w prints from seven different printers with five levels of tint coverage. Our results suggest that the image quality ruler method provides a reliable means to assess macro-uniformity. We then defined and implemented separate features to measure graininess, mottle, large area variation, jitter, and large-scale non-uniformity. The algorithms that we used are largely based on ISO image quality standards. Finally, we used these features computed for a set of test pages and the subjects' image quality ruler assessments of these pages to train the two different predictors - one based on linear regression and the other based on the support vector machine (SVM). Using five-fold cross-validation, we confirmed the efficacy of our predictor.

Paper Details

Date Published: 4 February 2013
PDF: 9 pages
Proc. SPIE 8653, Image Quality and System Performance X, 86530P (4 February 2013); doi: 10.1117/12.2008428
Show Author Affiliations
Weibao Wang, Purdue Univ. (United States)
Gary Overall, Lexmark International, Inc. (United States)
Travis Riggs, Lexmark International, Inc. (United States)
Rebecca Silveston-Keith, Lexmark International, Inc. (United States)
Julie Whitney, Lexmark International, Inc. (United States)
George Chiu, Purdue Univ. (United States)
Jan P. Allebach, Purdue Univ. (United States)


Published in SPIE Proceedings Vol. 8653:
Image Quality and System Performance X
Peter D. Burns; Sophie Triantaphillidou, Editor(s)

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