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Proceedings Paper

Fast iterative beam hardening correction based on frequency splitting in computed tomography
Author(s): Qiao Yang; Matthias Elter; Ingo Schasiepen; Nicole Maass; Joachim Hornegger
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Paper Abstract

In computed tomography (CT), the nonlinear characteristics of beam hardening are due to the polychromaticity of X-rays, which severely degrade the CT image quality and diagnostic accuracy. The correction of beam hardening has been an active area since the early years of CT, and various techniques have been developed. State­ of-the-art works on multi-material beam hardening correction (BHC) are mainly based on segmenting datasets into different materials, and correcting the non-linearity iteratively. Those techniques are limited in correction effectiveness due to inaccurate segmentation. Furthermore, most of them are computationally intensive. In this study, we introduce a fast BHC scheme based on frequency splitting with the fact that beam hardening artifacts mainly contain in the low frequency components and take more iterations to be corrected in comparison with high frequency components. After low-pass filtering and correcting artifacts at down-sampled projections, an artifact reduced high resolution reconstruction will be obtained by incorporating the original edge information from the high frequency components. Evaluations in terms of correction accuracy and computational efficiency are performed using simulated and real CT datasets. In comparison to the BHC algorithm without frequency splitting, the proposed accelerated algorithm yields comparable results in correcting cupping and streak artifacts with tremendously reduced computational effort. We conclude that the presented framework can achieve a significant speedup while still obtaining excellent artifact reduction. This is a significant practical advantage for clinical as well as industrial CT.

Paper Details

Date Published: 6 March 2013
PDF: 8 pages
Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 86682J (6 March 2013); doi: 10.1117/12.2007808
Show Author Affiliations
Qiao Yang, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
Siemens AG (Germany)
Matthias Elter, Siemens AG (Germany)
Ingo Schasiepen, Siemens AG (Germany)
Nicole Maass, Siemens AG (Germany)
Joachim Hornegger, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
School in Advanced Optical Technologies (Germany)


Published in SPIE Proceedings Vol. 8668:
Medical Imaging 2013: Physics of Medical Imaging
Robert M. Nishikawa; Bruce R. Whiting; Christoph Hoeschen, Editor(s)

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