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Proceedings Paper

Airborne spectral radiometry for crop health and yield estimation
Author(s): Eon O'Mongain; S. E.M. Green; James Edward Walsh; J. Burke
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Paper Abstract

Spectral reflectance measurements have been made over sugar beet crops from a helicopter during 1991, 1992, and 1993 using a portable multichannel spectrometer system. In 1994 the studies were extended to demonstrate the potential for the measurement of stress in other crops. The observations are made from an altitude of about 150 m over the spectral range 420 nm to 810 nm, with a bandwidth of 5 nm. Downwelling solar irradiance and upwelling reflected irradiance are monitored by the multichannel spectrometer simultaneously. Both the absolute values of the reflectance at each wavelength and the variance of these reflectance values across each plot are shown to be related to the state of the crop. Concurrent agricultural ground truth consisting of fresh leaf weight and dry matter accumulation, is used in defining the crop yield models. The study aims to determine the appropriate radiometrically derived parameters which could be used as alternative model inputs. Although significant spectral differences exist and can be extracted by conventional band ratio or singular value decomposition techniques, the variance in the samples of ground truth data constrain the ability to define meaningful radiometric parameters. Improved experimental procedures are proposed.

Paper Details

Date Published: 31 January 1995
PDF: 10 pages
Proc. SPIE 2314, Multispectral and Microwave Sensing of Forestry, Hydrology, and Natural Resources, (31 January 1995); doi: 10.1117/12.200751
Show Author Affiliations
Eon O'Mongain, Univ. College Dublin and Spectral Signatures Ltd. (Ireland)
S. E.M. Green, Univ. College Dublin and Spectral Signatures Ltd. (Ireland)
James Edward Walsh, Univ. College Dublin and Spectral Signatures Ltd. (Ireland)
J. Burke, Teagasc (Ireland)


Published in SPIE Proceedings Vol. 2314:
Multispectral and Microwave Sensing of Forestry, Hydrology, and Natural Resources
Eric Mougin; K. Jon Ranson; James Alan Smith, Editor(s)

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