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Proceedings Paper

An efficient visualization method for analyzing biometric data
Author(s): Mark Rahmes; Mike McGonagle; J. Harlan Yates; Ronda Henning; Jay Hackett
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Paper Abstract

We introduce a novel application for biometric data analysis. This technology can be used as part of a unique and systematic approach designed to augment existing processing chains. Our system provides image quality control and analysis capabilities. We show how analysis and efficient visualization are used as part of an automated process. The goal of this system is to provide a unified platform for the analysis of biometric images that reduce manual effort and increase the likelihood of a match being brought to an examiner’s attention from either a manual or lights-out application. We discuss the functionality of FeatureSCOPE™ which provides an efficient tool for feature analysis and quality control of biometric extracted features. Biometric databases must be checked for accuracy for a large volume of data attributes. Our solution accelerates review of features by a factor of up to 100 times. Review of qualitative results and cost reduction is shown by using efficient parallel visual review for quality control. Our process automatically sorts and filters features for examination, and packs these into a condensed view. An analyst can then rapidly page through screens of features and flag and annotate outliers as necessary.

Paper Details

Date Published: 31 May 2013
PDF: 8 pages
Proc. SPIE 8712, Biometric and Surveillance Technology for Human and Activity Identification X, 87120O (31 May 2013); doi: 10.1117/12.2006112
Show Author Affiliations
Mark Rahmes, Harris Corp. (United States)
Mike McGonagle, Harris Corp. (United States)
J. Harlan Yates, Harris Corp. (United States)
Ronda Henning, Harris Corp. (United States)
Jay Hackett, Harris Corp. (United States)


Published in SPIE Proceedings Vol. 8712:
Biometric and Surveillance Technology for Human and Activity Identification X
Ioannis Kakadiaris; Walter J. Scheirer; Laurence G. Hassebrook, Editor(s)

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