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Proceedings Paper

Plenoptic depth map in the case of occlusions
Author(s): Zhan Yu; Jingyi Yu; Andrew Lumsdaine; Todor Georgiev
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Paper Abstract

Recent realizations of hand-held plenoptic cameras have given rise to previously unexplored effects in photography. Designing a mobile phone plenoptic camera is becoming feasible with the significant increase of computing power of mobile devices and the introduction of System on a Chip. However, capturing high numbers of views is still impractical due to special requirements such as ultra-thin camera and low costs. In this paper, we analyze a mobile plenoptic camera solution with a small number of views. Such a camera can produce a refocusable high resolution final image if a depth map is generated for every pixel in the sparse set of views. With the captured multi-view images, the obstacle to recovering a high-resolution depth is occlusions. To robustly resolve these, we first analyze the behavior of pixels in such situations. We show that even under severe occlusion, one can still distinguish different depth layers based on statistics. We estimate the depth of each pixel by discretizing the space in the scene and conducting plane sweeping. Specifically, for each given depth, we gather all corresponding pixels from other views and model the in-focus pixels as a Gaussian distribution. We show how it is possible to distinguish occlusion pixels, and in-focus pixels in order to find the depths. Final depth maps are computed in real scenes captured by a mobile plenoptic camera.

Paper Details

Date Published: 7 March 2013
PDF: 9 pages
Proc. SPIE 8667, Multimedia Content and Mobile Devices, 86671S (7 March 2013); doi: 10.1117/12.2005847
Show Author Affiliations
Zhan Yu, Univ. of Delaware (United States)
Jingyi Yu, Univ. of Delaware (United States)
Andrew Lumsdaine, Indiana Univ. (United States)
Todor Georgiev, Qualcomm Inc. (United States)

Published in SPIE Proceedings Vol. 8667:
Multimedia Content and Mobile Devices
Reiner Creutzburg; Todor G. Georgiev; Dietmar Wüller; Cees G. M. Snoek; Kevin J. Matherson; David Akopian; Andrew Lumsdaine; Lyndon S. Kennedy, Editor(s)

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