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Proceedings Paper

Holographic diffraction gratings to measure micromovements
Author(s): Arturo Olivares-Pérez; Mayra Alejandra Lara-Peña; Janeth Alexandra García-Monge; Pavel Alejandro Valencia-Acuña; Joan Manuel Villa-Hernández; Israel Fuentes-Tapia
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Paper Abstract

Holographic diffraction gratings can measure micro movements, with a system that detects each period of the moving grating. One of the important features of this device is the grating period, which determines the measurement accuracy. The period can be on the order of fractions of micron, with high reproducibility and with an error of a quarter of period. One of the qualities of this system is its robustness; the measures are invariant to noise induced by device movements and environment thermal changes.

Paper Details

Date Published: 1 March 2013
PDF: 9 pages
Proc. SPIE 8644, Practical Holography XXVII: Materials and Applications, 864415 (1 March 2013); doi: 10.1117/12.2005439
Show Author Affiliations
Arturo Olivares-Pérez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Mayra Alejandra Lara-Peña, Univ. de Sonora (Mexico)
Janeth Alexandra García-Monge, Univ. de Sonora (Mexico)
Pavel Alejandro Valencia-Acuña, Univ. de Sonora (Mexico)
Joan Manuel Villa-Hernández, Univ. de Sonora (Mexico)
Israel Fuentes-Tapia, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)

Published in SPIE Proceedings Vol. 8644:
Practical Holography XXVII: Materials and Applications
Hans I. Bjelkhagen; V. Michael Bove, Editor(s)

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