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Proceedings Paper

Towards STED microscopy with nanometric optical sectioning
Author(s): Siddharth Sivankutty; Thomas Barroca; Guillaume Dupuis; Christophe Lefumeux; Céline Mayet; Arnaud Dubois; Catherine Marquer; Sandrine Lécart; Marie-Claude Potier; Emmanuel Fort; Sandrine Lévêque-Fort
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Paper Abstract

Circumventing the limit imposed by diffraction is a major issue in the instrumental development to realize finer resolutions in biological samples. With STED microscopy, we exploit the molecular transitions of the fluorescent marker to image well below the Rayleigh criterion. Also in combination with STED, we propose to use an alternative technique for optically sectioning fluorescent emitters close to the water-glass interface by selectively filtering the supercritical emission at the pupil plane. We discuss the instrumental development of such a system and its combination with other imaging techniques.

Paper Details

Date Published: 22 February 2013
PDF: 7 pages
Proc. SPIE 8590, Single Molecule Spectroscopy and Superresolution Imaging VI, 859018 (22 February 2013); doi: 10.1117/12.2004883
Show Author Affiliations
Siddharth Sivankutty, Institut des sciences moleculaires d'Orsay, CNRS, Univ. Paris-Sud (France)
LUMAT, CNRS, Univ. Paris-Sud (France)
Thomas Barroca, Institut Langevin, ESPCI ParisTech, CNRS (France)
Guillaume Dupuis, LUMAT, CNRS, Univ. Paris-Sud (France)
Christophe Lefumeux, Institut des Sciences Moléculaires d'Orsay, CNRS, Univ. Paris-Sud (France)
Céline Mayet, LUMAT, CNRS, Univ. Paris-Sud (France)
Arnaud Dubois, Lab. Charles Fabry- IOGS, CNRS, Univ. Paris-Sud (France)
Catherine Marquer, CRICM, CNRS, Univ. Pierre et Marie Curie (France)
Sandrine Lécart, LUMAT, CNRS, Univ. Paris-Sud (France)
Marie-Claude Potier, CRICM, CNRS, Univ. Pierre et Marie Curie (France)
Emmanuel Fort, Institut Langevin, ESPCI ParisTech, CNRS (France)
Sandrine Lévêque-Fort, Institut des sciences moléculaires d'orsay (France)


Published in SPIE Proceedings Vol. 8590:
Single Molecule Spectroscopy and Superresolution Imaging VI
Jörg Enderlein; Ingo Gregor; Zygmunt Karol Gryczynski; Rainer Erdmann; Felix Koberling, Editor(s)

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