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Proceedings Paper

Wave analysis of a plenoptic system and its applications
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Paper Abstract

Traditional imaging systems directly image a 2D object plane on to the sensor. Plenoptic imaging systems contain a lenslet array at the conventional image plane and a sensor at the back focal plane of the lenslet array. In this configuration the data captured at the sensor is not a direct image of the object. Each lenslet effectively images the aperture of the main imaging lens at the sensor. Therefore the sensor data retains angular light-field information which can be used for a posteriori digital computation of multi-angle images and axially refocused images. If a filter array, containing spectral filters or neutral density or polarization filters, is placed at the pupil aperture of the main imaging lens, then each lenslet images the filters on to the sensor. This enables the digital separation of multiple filter modalities giving single snapshot, multi-modal images. Due to the diversity of potential applications of plenoptic systems, their investigation is increasing. As the application space moves towards microscopes and other complex systems, and as pixel sizes become smaller, the consideration of diffraction effects in these systems becomes increasingly important. We discuss a plenoptic system and its wave propagation analysis for both coherent and incoherent imaging. We simulate a system response using our analysis and discuss various applications of the system response pertaining to plenoptic system design, implementation and calibration.

Paper Details

Date Published: 7 March 2013
PDF: 8 pages
Proc. SPIE 8667, Multimedia Content and Mobile Devices, 86671L (7 March 2013); doi: 10.1117/12.2004604
Show Author Affiliations
Sapna A. Shroff, Ricoh Innovations Inc. (United States)
Kathrin Berkner, Ricoh Innovations Inc. (United States)


Published in SPIE Proceedings Vol. 8667:
Multimedia Content and Mobile Devices
Dietmar Wüller; Kevin J. Matherson; Reiner Creutzburg; David Akopian; Todor G. Georgiev; Andrew Lumsdaine; Cees G. M. Snoek; Lyndon S. Kennedy, Editor(s)

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