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Proceedings Paper

Multispectral CMOS sensors with on-chip nanostructures for wavelength monitoring of LED devices
Author(s): Stephan Junger; Nanko Verwaal; Wladimir Tschekalinskij; Norbert Weber
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Paper Abstract

High-end illumination devices based on LEDs require precise color matching, because the dominant wavelength depends on temperature and changes due to aging. We demonstrate the performance of multispectral sensors fabricated using a complementary metal-oxide semiconductor (CMOS) process for color-sensing feedback. Various plasmonic nanostructures were simulated and implemented to achieve band pass and cut-off filters, placed on top of photodiodes. These devices for multispectral sensing can be fabricated in high volume and measurements indicate that a wavelength change of 3 nm yields a relative signal change of more than 20 % due to the steep-edge characteristics of the filters.

Paper Details

Date Published: 4 March 2013
PDF: 6 pages
Proc. SPIE 8641, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVII, 86411B (4 March 2013); doi: 10.1117/12.2004497
Show Author Affiliations
Stephan Junger, Fraunhofer Institute for Integrated Circuits (Germany)
Nanko Verwaal, Fraunhofer Institute for Integrated Circuits (Germany)
Wladimir Tschekalinskij, Fraunhofer Institute for Integrated Circuits (Germany)
Norbert Weber, Fraunhofer Institute for Integrated Circuits (Germany)


Published in SPIE Proceedings Vol. 8641:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVII
Klaus P. Streubel; Heonsu Jeon; Li-Wei Tu; Martin Strassburg, Editor(s)

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