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Proceedings Paper

New analog readout architecture for low noise CMOS image sensors using column-parallel forward noise-canceling circuitry
Author(s): Tsung-Ling Li; Yasuyuki Goda; Shunichi Wakashima; Rihito Kuroda; Shigetoshi Sugawa
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Paper Abstract

This paper presents a new analog readout architecture for low-noise CMOS image sensors. A proposed forward noisecanceling circuitry has been developed in our readout architecture to provide a sharper noise-filtering. The new readout architecture consists of a column high-gain amplifier with correlated-double-sampling (CDS), a column forward noisecanceling circuitry, and column sample-and-hold circuits. Through the high-gain amplifier together with the forward noise-canceling circuitry, this readout architecture effectively reduces random noise of in-pixel source follower and column amplifier as well as temporal line noise from power supplies and pulse lines. A prototype 400(H) x 250(V) CMOS image sensor using the new readout architecture has been fabricated in a 0.18 μm 1-Poly 3-Metal CMOS technology with pinned-photodiode. Both the pixel pitch and the column circuit pitch are 4.5 μm. The input-referred noise of the new readout architecture is 37 μVrms, which has been reduced by 23 % compared to that of the conventional readout architecture. The input-referred noise of the pixel with new readout architecture is 72 μVrms, which has been reduced by 24 % compared to that of the pixel with conventional readout architecture.

Paper Details

Date Published: 19 February 2013
PDF: 9 pages
Proc. SPIE 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, 86590E (19 February 2013); doi: 10.1117/12.2003741
Show Author Affiliations
Tsung-Ling Li, Tohoku Univ. (Japan)
Yasuyuki Goda, Tohoku Univ. (Japan)
Shunichi Wakashima, Tohoku Univ. (Japan)
Rihito Kuroda, Tohoku Univ. (Japan)
Shigetoshi Sugawa, Tohoku Univ. (Japan)


Published in SPIE Proceedings Vol. 8659:
Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
Ralf Widenhorn; Antoine Dupret, Editor(s)

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