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Proceedings Paper

Using submicron-resolution LiF crystal and film x-ray detectors for the near and far fields in-situ characterization of soft x-ray laser beams
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Paper Abstract

Review of results, obtained by using recently proposed new imaging detector, based on formation of color centers in LiF crystal and LiF film, for in situ high performance measurements of near-field and far-field properties of soft X-ray lasers (SXRL) beams is presented. Experiments have been carried out with laser-driven transient-collision plasma SXRL and free electron SXRL beams. It was demonstrated that due to favorable combination of high spatial resolution, high dynamic range and wide field of view this technique allows measuring not only intensity distribution across the full beam and in local areas, but also permits to evaluate coherence and spectral distribution of radiation across the beam. Experimental diffraction patterns in the images of periodical structures are analyzed by comparison with the modeled ones in the last case. The estimated accuracy of measurements is between 10-20%.

Paper Details

Date Published: 11 December 2012
PDF: 13 pages
Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 86780B (11 December 2012); doi: 10.1117/12.2003489
Show Author Affiliations
Tatiana A. Pikuz, Japan Atomic Energy Agency (Japan)
Joint Institute for High Temperatures (Russian Federation)
Anatoly Ya. Faenov, Japan Atomic Energy Agency (Japan)
Joint Institute for High Temperatures (Russian Federation)
Yuji Fukuda, Japan Atomic Energy Agency (Japan)
Yoshiaki Kato, The Graduate School for the Creation of New Photonics Industries (Japan)
Tetsuya Kawachi, Japan Atomic Energy Agency (Japan)
Masaki Kando, Japan Atomic Energy Agency (Japan)


Published in SPIE Proceedings Vol. 8678:
Short-Wavelength Imaging and Spectroscopy Sources
Davide Bleiner, Editor(s)

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