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Proceedings Paper

Absolute measurements of the reflection coefficients of multilayer x-ray mirrors in the ultrasoft x-ray region
Author(s): I. I. Lyakhovskaya
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Paper Abstract

The angular dependencies of the reflection coefficients of ultrasoft X- ray radiation by X-ray interference mirrors were investigated for samples prepared by two methods: magnetron spattering and electron beam evaporation. The theoretical evaluations of these reflection coefficients were compared with the obtained experimental results. The investigated multilayer X-ray mirrors were found to have extremely high quality.

Paper Details

Date Published: 23 January 1995
PDF: 6 pages
Proc. SPIE 2453, X-Ray Optics and Surface Science, (23 January 1995); doi: 10.1117/12.200281
Show Author Affiliations
I. I. Lyakhovskaya, St. Petersburg Univ. (Russia)

Published in SPIE Proceedings Vol. 2453:
X-Ray Optics and Surface Science
Alexander V. Vinogradov, Editor(s)

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