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Proceedings Paper

Calculation of defect modes in index contrast of AlxGa1-xAs waveguides
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Paper Abstract

This letter presents the theoretical investigation model to calculate the defect modes, modes loss of the slab, the group velocity of the defect region, and then calculate the normalized frequency of the defect region of AlxGa1-xAs at a wavelength of 1550 nm. A fast Fourier transform method was used to find the effect of varying refractive index on the modes frequency. This change of the refractive index enhancement is attributed to the transmission.

Paper Details

Date Published: 13 March 2013
PDF: 5 pages
Proc. SPIE 8627, Integrated Optics: Devices, Materials, and Technologies XVII, 862718 (13 March 2013); doi: 10.1117/12.2002627
Show Author Affiliations
Latef M. Ali, Erbil Technical Institute (Iraq)
Farah A. Abed, Erbil Technical Institute (Iraq)


Published in SPIE Proceedings Vol. 8627:
Integrated Optics: Devices, Materials, and Technologies XVII
Jean Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)

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