Share Email Print
cover

Proceedings Paper

Research on new stitching interferometric testing for CPP
Author(s): Hao Yan; Chunlin Yang; Qikai Shi; Shenglin Wen; Jian Wang; Liming Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The test of wavefront of large aperture continuous phase plate(CPP) is difficult to obtain by whole aperture once because of CPP’s characteristic such as large phase depth and large phase gradient,so sub-aperture stitching technique is often used to test the CPP’s wavefront in whole aperture.We analysed some problems in the traditional sub-aperture stitching test and put forward a new stitching model mathematically in order to improve the precision in CPP’s sub-aperture stitching test.We have found that this new model is available by a serial experiments.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84173B (15 October 2012); doi: 10.1117/12.2002561
Show Author Affiliations
Hao Yan, Chengdu Fine Optical Engineering Research Ctr. (China)
Chunlin Yang, Chengdu Fine Optical Engineering Research Ctr. (China)
Qikai Shi, Chengdu Fine Optical Engineering Research Ctr. (China)
Shenglin Wen, Chengdu Fine Optical Engineering Research Ctr. (China)
Jian Wang, Chengdu Fine Optical Engineering Research Ctr. (China)
Liming Yang, Chengdu Fine Optical Engineering Research Ctr. (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top