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Proceedings Paper

Study on stress birefringence measurement of uni-axial crystal
Author(s): Xiaohong Wei; Liqun Chai; Qiang Li; Bo Gao
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Paper Abstract

Residual stress birefringence in crystal will affect frequency conversion efficiency and beam quality. In this paper the distribution characteristics of inherent stress birefringence in crystal is analyzed, through delicate adjustment the optical axis is oriented and qualitative results obtained for KDP crystals are presented and discussed by imaging digital stress measurement instrument, and the stress gradient distribution is calculated, also the effect of deviation from optical axis on the measured stress distribution results is discussed.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84172R (15 October 2012); doi: 10.1117/12.2002560
Show Author Affiliations
Xiaohong Wei, Chengdu Fine Optical Engineering Research Ctr. (China)
Liqun Chai, Chengdu Fine Optical Engineering Research Ctr. (China)
Qiang Li, Chengdu Fine Optical Engineering Research Ctr. (China)
Bo Gao, Chengdu Fine Optical Engineering Research Ctr. (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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