Share Email Print
cover

Proceedings Paper

Study on the precision measurement of high-flux large aperture sampling grating
Author(s): Haoyu Yuan; Yong-quan Chen; Zhi-tao Peng; Ya-xuan Duan; Jianhong Wu; Shaojun Fu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper describes an effective method for the measurements of large aperture sampling grating, the sampling efficiency the sampling focal length and the sampling angle. By using a 351nm collimation laser source to scan the full aperture of the sampling grating in every subregion, the diffraction power of “0” order and “+1” order can be obtained synchronously by two standard integrating balls, And then by calculating the sampling efficiency of this subregion and splicing the acquisition data, we can get the averaged grating sampling efficiency in the full aperture.Based on this method, we can effectively eliminate the effect of the output instability of laser source, decrease the uncertainty of test results. According to the fabrication principle of the sampling grating, measurements for the sampling focal length and the sampling angle can be performed. Test rersults indicate that this method can be used to measure large aperture sampling gratings

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170W (15 October 2012); doi: 10.1117/12.2002127
Show Author Affiliations
Haoyu Yuan, Research Ctr. of Laser Fusion (China)
Yong-quan Chen, Xian Institute of Optics and Precision Mechanics (China)
Zhi-tao Peng, Research Ctr. of Laser Fusion (China)
Ya-xuan Duan, Xian Institute of Optics and Precision Mechanics (China)
Jianhong Wu, Soochow Univ. (China)
Shaojun Fu, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top