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Proceedings Paper

Ultrafast dynamics in topological insulators
Author(s): C. W. Luo; H.-J. Chen; H. J. Wang; S. A. Ku; K. H. Wu; T. M. Uen; J. Y. Juang; J.-Y. Lin; B. L. Young; T. Kobayashi; R. Sankar; F. C. Chou; H. Berger; G. D. Gu
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Paper Abstract

Ultrafast dynamics of carriers and phonons in topological insulators CuxBi2Se3-y (x=0, 0.1, 0.125, y=0, 1) was studied using femtosecond optical pump-probe spectroscopy. One damped oscillation was clearly observed in the transient reflectivity changes (ΔR/R), which is assigned to the coherent optical phonon (A1g 1). According to the red shift of A1g1 phonon frequency, the Cu atoms in CuxBi2Se3 crystals may predominantly intercalated between pair of the quintuple layers. Moreover, the carrier dynamics in the Dirac-cone surface state is significantly different from that in bulk state, which was investigated using optical pump mid-infrared (mid-IR) probe spectroscopy. The rising time and decay time of the negative component in ΔR/R, which is assigned to carrier relaxation in Dirac cone, is 1.62 ps and 20.5 ps, respectively.

Paper Details

Date Published: 14 March 2013
PDF: 7 pages
Proc. SPIE 8623, Ultrafast Phenomena and Nanophotonics XVII, 86230D (14 March 2013); doi: 10.1117/12.2001954
Show Author Affiliations
C. W. Luo, National Chiao Tung Univ. (Taiwan)
H.-J. Chen, National Chiao Tung Univ. (Taiwan)
H. J. Wang, National Chiao Tung Univ. (Taiwan)
S. A. Ku, National Chiao Tung Univ. (Taiwan)
K. H. Wu, National Chiao Tung Univ. (Taiwan)
T. M. Uen, National Chiao Tung Univ. (Taiwan)
J. Y. Juang, National Chiao Tung Univ. (Taiwan)
J.-Y. Lin, National Chiao Tung Univ. (Taiwan)
B. L. Young, National Chiao Tung Univ. (Taiwan)
T. Kobayashi, National Chiao Tung Univ. (Taiwan)
R. Sankar, National Taiwan Univ. (Taiwan)
F. C. Chou, National Taiwan Univ. (Taiwan)
H. Berger, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
G. D. Gu, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 8623:
Ultrafast Phenomena and Nanophotonics XVII
Markus Betz; Abdulhakem Y. Elezzabi; Jin-Joo Song; Kong-Thon Tsen, Editor(s)

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