Share Email Print
cover

Proceedings Paper

Experimental techniques for aberration retrieval with through-focus intensity images
Author(s): S. F. Pereira; A. Wiegmann; N. Kumar; A. da Costa Assafrao; A. Polo; L. Wei; S. van Haver
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Measurement techniques to determine the aberration of an optical system, by obtaining through-focus intensity images that are produced when the object is a point source at infinity, are shown. The analysis of the aberrations is made using the extended version of the Nijboer-Zernike diffraction theory. This theory provides a semi analytical solution of the Debye diffraction integral and thus a direct relation between the intensity distribution of the field at the focal region and the exit pupil of the optical system.

Paper Details

Date Published: 26 November 2012
PDF: 7 pages
Proc. SPIE 8557, Optical Design and Testing V, 855706 (26 November 2012); doi: 10.1117/12.2000376
Show Author Affiliations
S. F. Pereira, Technische Univ. Delft (Netherlands)
A. Wiegmann, Physikalisch-Technische Bundesanstalt (Germany)
N. Kumar, Technische Univ. Delft (Netherlands)
A. da Costa Assafrao, Technische Univ. Delft (Netherlands)
A. Polo, Technische Univ. Delft (Netherlands)
L. Wei, Technische Univ. Delft (Netherlands)
S. van Haver, Technische Univ. Delft (Netherlands)


Published in SPIE Proceedings Vol. 8557:
Optical Design and Testing V
Yongtian Wang; Chunlei Du; Hong Hua; Kimio Tatsuno; H. Paul Urbach, Editor(s)

© SPIE. Terms of Use
Back to Top