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Proceedings Paper

The effect of dopant diffusion on modal birefringence in silica-on-silicon waveguides
Author(s): Patrick Dumais; Claire Callender; Chris Ledderhof
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Paper Abstract

Polarization-multiplexed optical signals require that the birefringence of optical devices be controlled. Birefringence in silica-on-silicon waveguides emerges from a combination of form birefringence and stress birefringence, both of which can be affected by the core dopant distribution in the case of rectangular-core waveguides. In this paper, we present a numerical and experimental study of the effect of dopant diffusion on waveguide modal birefringence. In the numerical study, modal birefringence is calculated with a finite element model that includes thermal stress effects. The effect of diffusion on form birefringence and stress birefringence will be illustrated. It will be shown that the initial index step of the waveguide has an influence on the evolution of the modal birefringence as a function of diffusion. In the experimental study, measurements of the phase and group birefringence will be presented as a function of waveguide width for waveguides with thermally diffused cores. It will be shown that thermal diffusion can be used for birefringence control of rectangular waveguides.

Paper Details

Date Published: 24 October 2012
PDF: 5 pages
Proc. SPIE 8412, Photonics North 2012, 84120V (24 October 2012); doi: 10.1117/12.2000113
Show Author Affiliations
Patrick Dumais, Communications Research Ctr. Canada (Canada)
Claire Callender, Communications Research Ctr. Canada (Canada)
Chris Ledderhof, Communications Research Ctr. Canada (Canada)


Published in SPIE Proceedings Vol. 8412:
Photonics North 2012
Jean-Claude Kieffer, Editor(s)

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