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Proceedings Paper

The impact of external optical feedback on the degradation behavior of high-power diode lasers
Author(s): Martin Hempel; Mingjun Chi; Paul M. Petersen; Ute Zeimer; Markus Weyers; Jens W. Tomm
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Paper Abstract

The impact of external feedback on high-power diode laser degradation is studied. For this purpose early stages of gradual degradation are prepared by accelerated aging of 808-nm-emitting AlGaAs-based devices. While the quantum well that actually experiences the highest total optical load remains unaffected, severe impact is observed to the cladding layers and the waveguide. Consequently hardening of diode lasers for operation under external optical feedback must necessarily involve claddings and waveguide, into which the quantum well is embedded.

Paper Details

Date Published: 26 February 2013
PDF: 8 pages
Proc. SPIE 8605, High-Power Diode Laser Technology and Applications XI, 86050L (26 February 2013); doi: 10.1117/12.2000067
Show Author Affiliations
Martin Hempel, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Forschungsverbund Berlin e.V. (Germany)
Mingjun Chi, Technical Univ. of Denmark (Denmark)
Paul M. Petersen, Technical Univ. of Denmark (Denmark)
Ute Zeimer, Ferdinand-Braun-Institut (Germany)
Forschungsverbund Berlin e.V. (Germany)
Markus Weyers, Ferdinand-Braun-Institut (Germany)
Forschungsverbund Berlin e.V. (Germany)
Jens W. Tomm, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Forschungsverbund Berlin e.V. (Germany)


Published in SPIE Proceedings Vol. 8605:
High-Power Diode Laser Technology and Applications XI
Mark S. Zediker, Editor(s)

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