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Proceedings Paper

Stretching and bending with flexible FTIR process monitors, probes, and software
Author(s): David C. Peters
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Paper Abstract

The use of FT-IR spectroscopy, either in the mid-IR region or near-IR region, offers fundamental advantages over other technologies. Spectral region selection criteria are reviewed, to help define when to use the mid-IR region or the near-IR region (or even when to use parts of both New fiber optic sampling probes for transmission, attenuated total reflection, diffuse reflection and web sensing have solved nagging problems. What many process analyzer specialists are discovering is that new probes are becoming available each month, offering newer process tolerance (can tolerate higher temp or pressure) or even new sampling approaches altogether. This paper describes on-line applications in pharmaceuticals, specialty chemicals, polymer production and refinery production which demonstrate the range of techniques used to appropriately optimize the on- line analyzer. In addition, calibration transfer issues are discussed, demonstrating the importance of the software tools to help sort out the causes for cal errors (spectral contamination, etc.).

Paper Details

Date Published: 19 January 1995
PDF: 13 pages
Proc. SPIE 2367, Optical Sensors for Environmental and Chemical Process Monitoring, (19 January 1995); doi: 10.1117/12.199662
Show Author Affiliations
David C. Peters, KVB/Analect FT-IR (United States)


Published in SPIE Proceedings Vol. 2367:
Optical Sensors for Environmental and Chemical Process Monitoring
Ishwar D. Aggarwal; Stuart Farquharson; Eric Koglin, Editor(s)

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