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Proceedings Paper

Absorption and scattering in the single layers of the ocular fundus
Author(s): Martin Hammer; Andre Roggan; Dietrich Schweitzer
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Paper Abstract

Various model calculations on the light transport at the ocular fundus are used in the literature either for interpretation of in-vivo reflectance measurements or for the prediction of photocoagulation effects. All these models take into account the absorption spectra of the pigments, known to be located at the eye ground: melanin, hemoglobin, xanthophyll and the receptor pigments. However light scattering inside the single fundus layers has not been investigated in detail and is therefore neglected in the calculations or is only considered by very rough approximations. This paper presents measurements at specimen of retina, retinal pigment epithelium, choroid and sclera using double integrating sphere technique. Absorption coefficients, scattering coefficients, and anisotropy of scattering were calculated by an inverse Monte-Carlo simulation from the measured collimated and diffuse transmittance and diffuse reflectance. Additional goniophotometric measurements were performed to determine the effect of the parallel aligned photoreceptors on the radiation transport. Conclusions are drawn for the interpretation of fundus reflectance measurements, which are a potentially useful tool in diagnostics and photocoagulation dosimetry, and for the calculation of temperature profiles, modelling the effect of coagulation.

Paper Details

Date Published: 18 January 1995
PDF: 12 pages
Proc. SPIE 2323, Laser Interaction with Hard and Soft Tissue II, (18 January 1995); doi: 10.1117/12.199208
Show Author Affiliations
Martin Hammer, Friedrich-Schiller-Univ. Jena (Germany)
Andre Roggan, Laser-Medizin-Zentrum GmbH (Germany)
Dietrich Schweitzer, Friedrich-Schiller-Univ. Jena (Germany)

Published in SPIE Proceedings Vol. 2323:
Laser Interaction with Hard and Soft Tissue II
Hans Joerg Albrecht; Guy P. Delacretaz; Thomas H. Meier; Rudolf W. Steiner; Lars Othar Svaasand; Martin J. C. van Gemert, Editor(s)

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