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Proceedings Paper

Noninvasive measurement of moisture distribution in individual wheat kernels by magnetic resonance imaging
Author(s): Huaipu Song; Stephen R. Delwiche; Michael J. Line
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Paper Abstract

The distribution and migration of moisture in wheat kernels during storage and milling are important for controlling wheat quality and milling performance. A non-destructive microscopic magnetic resonance imaging (MRI) technique was applied to measure the 3D distribution of moisture in individual wheat kernels. Soft white winter wheat kernels at approximately 12% moisture content were measured. A 3D Fourier transform pulse sequence with a short echo time (TE) was used to acquire proton images. The image data were zero- filled to improve spatial resolution. The spatial resolution of the images was 78 micrometers X 62 micrometers X 62 micrometers . The 3D proton density images were related to the 3D moisture distribution in the wheat kernels. For wheat kernels equilibrated to a water activity of 0.53 aw, the moisture distribution in the starchy endosperm of the wheat was fairly uniform in the three principal (orthogonal) directions. To quantify moisture distribution and movement in wheat kernels during the moisture-tempering process, the microscopic MRI with a shorter TE 3D pulse sequence will be used in future research. The results of the measurements will be used to characterize the quantity and nature of kernel moisture and relate these to kernel physiology, physical-chemical properties, and milling performance.

Paper Details

Date Published: 6 January 1995
PDF: 9 pages
Proc. SPIE 2345, Optics in Agriculture, Forestry, and Biological Processing, (6 January 1995); doi: 10.1117/12.198862
Show Author Affiliations
Huaipu Song, USDA Agricultural Research Service (United States)
Stephen R. Delwiche, USDA Agricultural Research Service (United States)
Michael J. Line, USDA Agricultural Research Service (United States)


Published in SPIE Proceedings Vol. 2345:
Optics in Agriculture, Forestry, and Biological Processing
George E. Meyer; James A. DeShazer, Editor(s)

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