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Proceedings Paper

Simulation of illumination for machine vision and inspection
Author(s): Norman R. Guivens
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Paper Abstract

Illumination subsystems are critical elements of most machine vision and inspection systems. The linear response of most optical detectors generally requires much more uniform illumination than the logarithmic response of the human eye to achieve a similar level of performance. Excessive illumination can saturate optical detector elements, while insufficient illumination causes excessive shot noise that can cripple system performance. Speckle from coherent or partially coherent illumination can also affect system performance. Computer simulations of machine vision and inspection systems, like SPARTA's SENSORSIM, permit accurate analysis of various illumination designs to determine their suitability for a particular application. These simulations permit rapid analysis of system configurations and variation of system parameters to identify optimal designs on a price/performance curve. SENSORSIM can also provide images or other signatures at intermediate stages of the generation process for isolation and analysis sources of degradation in a sensor system. This sort of analysis often is not possible in laboratory experiments. Although models of more limited scope may be useful for some analyses, such models cannot support analysis of phenomena that depend upon interaction among several components or subsystems. Thus, simulations like SENSORSIM provide an invaluable capability for optimizing the cost and performance of optical sensor systems.

Paper Details

Date Published: 6 January 1994
PDF: 12 pages
Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); doi: 10.1117/12.198834
Show Author Affiliations
Norman R. Guivens, SPARTA, Inc. (United States)


Published in SPIE Proceedings Vol. 2348:
Imaging and Illumination for Metrology and Inspection
Donald J. Svetkoff, Editor(s)

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