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Proceedings Paper

Detecting rolling element bearing defects with the optical incremental motion encoder
Author(s): Kayode A. Ayandokun; P. A. Orton; Nasser Sherkat; Peter D. Thomas
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Paper Abstract

This paper described the experimental use of a new type of optical sensor to detect rolling element bearing defects for the purpose of condition monitoring. The incremental motion encoder (IME) is a patented development of the industrially proven technology of the optical shaft encoder. It combines the measurement of angular position with that of 2D shaft center position to submicron accuracy. The operational principle of the IME is explained. Its high resolution measurements allow shaft motion directly related to the condition of the supporting bearing to be sensed. This presents potential advantages over current bearing condition monitoring sensors which monitor transmitted vibration in the machine structure. A model explaining the effect of a bearing condition monitoring sensors which monitor transmitted vibration in the machine structure. A model explaining the effect of a bearing inner race defect on the IME signal is presented. Based on this model the statistical parameter kurtosis is proposed as a method of detecting such defects from the IME signal. The results of experiments comparing the IME signal from a new undamaged roller bearing with the signal from the same bearing with an induced defect are presented. These confirm the application of the model to defect detection.

Paper Details

Date Published: 4 January 1995
PDF: 12 pages
Proc. SPIE 2349, Industrial Optical Sensors for Metrology and Inspection, (4 January 1995); doi: 10.1117/12.198698
Show Author Affiliations
Kayode A. Ayandokun, Nottingham Trent Univ. (United Kingdom)
P. A. Orton, Nottingham Trent Univ. (United Kingdom)
Nasser Sherkat, Nottingham Trent Univ. (United Kingdom)
Peter D. Thomas, Nottingham Trent Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2349:
Industrial Optical Sensors for Metrology and Inspection
Kevin G. Harding; H. Philip Stahl, Editor(s)

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