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Proceedings Paper

Phase measurement using a liquid crystal point diffraction interferometer
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Paper Abstract

A point diffraction interferometer with a liquid crystal filter is used to measure a phase object. A reference beam is locally generated by a microsphere embedded within the liquid crystal layer. Phase shifts between the object and reference beams are introduced by varying a voltage across the birefringent nematic liquid crystal layer. Periodic phase measurement errors caused by modulations in the average intensity distributions are discussed, and a normalization method is described to reduce the errors. Experimental results are compared to a computer simulation to verify that the periodic errors are caused by intensity variations in the object beam.

Paper Details

Date Published: 4 January 1995
PDF: 5 pages
Proc. SPIE 2349, Industrial Optical Sensors for Metrology and Inspection, (4 January 1995); doi: 10.1117/12.198695
Show Author Affiliations
Carolyn R. Mercer, NASA Lewis Research Ctr. (United States)
Katherine Creath, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 2349:
Industrial Optical Sensors for Metrology and Inspection
Kevin G. Harding; H. Philip Stahl, Editor(s)

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