Share Email Print
cover

Proceedings Paper

Infrared vision techniques in quality control of surface-mount circuit board solder paste printing
Author(s): Jarmo T. Alander; Mikko Huusko; Aimo Karonen; Jari Kuusrainen; Lars Unonius
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this work we have applied infrared camera techniques in a prototype of a quality control system for surface mount circuit board solder paste printing. The prototype system consists of a stepper motor controlled conveyor for board transportation and indexing, an infrared camera for paste pad temperature profile recording, a CCD camera for board and pad registration and recording, a pulse heating set-up, a video frame grabber and signal processor unit for preliminary image processing, and a PC for operator control, high level autonomous control and processing of preprocessed infrared and visual image data and communications with the other shop floor information and quality control systems. The operator interface is built on top of Windows 3.1, which makes it easy to operate and to connect to other programs at will. The prototype system was capable to process the locations and areas at over 100 solder paste pads per second speed and to evaluate the volumes of the pads within error tolerance of approximately equals 20%. The most severe obstacle in applying IR techniques in SMT product lines seems to be the current high cost of suitable IR scanning devices. Only slightly modified, the developed infrared quality control and testing system prototype can be used also in other electronics assembly line applications like solder checking and functional checking of boards by monitoring the thermal properties of solders and components correspondingly.

Paper Details

Date Published: 4 January 1995
PDF: 10 pages
Proc. SPIE 2349, Industrial Optical Sensors for Metrology and Inspection, (4 January 1995); doi: 10.1117/12.198690
Show Author Affiliations
Jarmo T. Alander, Univ. of Vaasa (Finland)
Mikko Huusko, Helsinki Institute of Technology (Finland)
Aimo Karonen, Helsinki Institute of Technology (Finland)
Jari Kuusrainen, Helsinki Institute of Technology (Finland)
Lars Unonius, Helsinki Institute of Technology (Finland)


Published in SPIE Proceedings Vol. 2349:
Industrial Optical Sensors for Metrology and Inspection
Kevin G. Harding; H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top