Share Email Print

Proceedings Paper

IMETRICS TP200: a system for high accuracy 3D image metrology
Author(s): Horst A. Beyer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High-Accuracy 3D Image Metrology now plays an increasingly important role in a variety of industrial and non-industrial settings, including in particular the area of industrial quality control. This can be directly attributed to the dramatic improvements that have taken place over the past several years in the techniques and algorithms used, as well as in the hardware that is currently available. This paper first gives an overview of factors influencing the geometric and radiometric characteristics of CCD-cameras and imaging systems used for 3D image metrology, which includes a discussion of various existing problem sources. Second, techniques for the geometric calibration of CCD-cameras for high-accuracy 3D image metrology are addressed. Third, elements of the IMETRICS TP200 System are outlined in order to demonstrate the hardware readily available on the market. Finally, a number of applications are shown in order to show the state-of-the-art. Results from numerous tests demonstrated that accuracies corresponding to 1/50th of a pixel spacing can be attained under severe industrial conditions.

Paper Details

Date Published: 23 November 1994
PDF: 10 pages
Proc. SPIE 2249, Automated 3D and 2D Vision, (23 November 1994); doi: 10.1117/12.196118
Show Author Affiliations
Horst A. Beyer, IMETRIC (Switzerland)

Published in SPIE Proceedings Vol. 2249:
Automated 3D and 2D Vision
Rolf-Juergen Ahlers; Donald W. Braggins; Gary W. Kamerman, Editor(s)

© SPIE. Terms of Use
Back to Top