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Proceedings Paper

Contour analysis algorithms for high-speed inspection
Author(s): Knut Kille
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Paper Abstract

The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g. scale-space analysis) will be presented. The performance of different approaches is shown by several industrial examples and applications.

Paper Details

Date Published: 23 November 1994
PDF: 10 pages
Proc. SPIE 2249, Automated 3D and 2D Vision, (23 November 1994); doi: 10.1117/12.196084
Show Author Affiliations
Knut Kille, Fraunhofer-Institut fuer Produktionstechnik und Automatisierung (Germany)

Published in SPIE Proceedings Vol. 2249:
Automated 3D and 2D Vision
Rolf-Juergen Ahlers; Donald W. Braggins; Gary W. Kamerman, Editor(s)

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