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Proceedings Paper

Measurement of absolute object deformations by means of two-wavelength electronic speckle pattern interferometry (ESPI)
Author(s): Horst Kreitlow; Hans-Joachim Miesner; J. Stockmann
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Paper Abstract

Automatic processing of interferometric fringe patterns using the phase step method only leads to relative values of the deformation vector components. Extending this method to two wavelengths absolute values can be gained as known from classical interferometry. The optical as well as electronical and software expansion of an ESPI is presented allowing the system to determine absolute deformation components by automatic evaluation of fringe patterns by means of the phase step method with two wavelengths.

Paper Details

Date Published: 12 December 1994
PDF: 10 pages
Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); doi: 10.1117/12.195914
Show Author Affiliations
Horst Kreitlow, Fachhochschule Ostfriesland (Germany)
Hans-Joachim Miesner, Fachhochschule Ostfriesland (Germany)
J. Stockmann, Fachhochschule Ostfriesland (Germany)


Published in SPIE Proceedings Vol. 2340:
Interferometry '94: New Techniques and Analysis in Optical Measurements
Malgorzata Kujawinska; Krzysztof Patorski, Editor(s)

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