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Proceedings Paper

Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms
Author(s): Maria Pirga; Malgorzata Kujawinska
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Paper Abstract

Various interferometric and fringe projection techniques may result in complex interferograms with the information about the phenomena tested. Recent applications require the analysis on the base of a single interferogram. Here, we address two problems: simultaneous analysis of the information about two events and analysis of interferogram with high phase gradients in both x and y directions. The analysis of an interferogram is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the two procedures proposed is presented.

Paper Details

Date Published: 12 December 1994
PDF: 7 pages
Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); doi: 10.1117/12.195907
Show Author Affiliations
Maria Pirga, Warsaw Univ. of Technology (Poland)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 2340:
Interferometry '94: New Techniques and Analysis in Optical Measurements
Malgorzata Kujawinska; Krzysztof Patorski, Editor(s)

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