Share Email Print
cover

Proceedings Paper

Applications of recently improved electronic speckle pattern interferometry by addition of incremental images
Author(s): Manfred H. F. Hertwig; Thierry Floureux; Torsten Flemming
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper demonstrates the advantages of a recently reported improved technique of phase- shifted electronic speckle interferometry. The improvement extends the range and enhances the accuracy of measurements and thus unlocks many new applications. One of these is detecting various types of fatigue damage in carbon-fiber-reinforced plastics (CFRP). The optical measurements of surface matrix cracks and of delaminations agree very well with the results of other non-destructive testing (NDT) methods. We also demonstrate an improved contouring technique and present the theory behind the experimental procedure, leading to the improved results reported here.

Paper Details

Date Published: 12 December 1994
PDF: 10 pages
Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); doi: 10.1117/12.195901
Show Author Affiliations
Manfred H. F. Hertwig, Swiss Federal Institute of Technology (Switzerland)
Thierry Floureux, Swiss Federal Institute of Technology (Switzerland)
Torsten Flemming, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 2340:
Interferometry '94: New Techniques and Analysis in Optical Measurements
Malgorzata Kujawinska; Krzysztof Patorski, Editor(s)

© SPIE. Terms of Use
Back to Top