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Proceedings Paper

High-temperature-resistant gratings for moire interferometry
Author(s): Colin Forno
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Paper Abstract

A simple technique, based on metallized photoresist gratings, offers a method of using moire interferometry on components which are subjected to high temperatures. The approach has been used to measure residual stresses in components by the process of annealing.

Paper Details

Date Published: 30 November 1994
PDF: 6 pages
Proc. SPIE 2342, Interferometry '94: Photomechanics, (30 November 1994); doi: 10.1117/12.195508
Show Author Affiliations
Colin Forno, National Physical Lab. (United Kingdom)

Published in SPIE Proceedings Vol. 2342:
Interferometry '94: Photomechanics
Ryszard J. Pryputniewicz; Jacek Stupnicki, Editor(s)

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