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Proceedings Paper

Low-noise and conductively cooled microchannel plates
Author(s): W. Bruce Feller
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Paper Abstract

Microchannel plate (MCP) dynamic range has recently been enhanced for both very low and very high input flux conditions. Improvements in MCP manufacturing technology reported earlier have led to MCPs with substantially reduced radioisotope levels, giving dramatically lower internal background-counting rates. An update is given on the Galileo low noise MCP. Also, new results in increasing the MCP linear counting range for high input flux densities are presented. By bonding the active face of a very low resistance MCP (less than 1 megaohm) to a substrate providing a conductive path for heat transport, the bias current limit (hence, MCP output count rate limit) can be increased up to two orders of magnitude. Normal pulse-counting MCP operation was observed at bias currents of several mA when a curved-channel MCP (80:1) was bonded to a ceramic multianode substrate; the MCP temperature rise above ambient was less than 40 C.

Paper Details

Date Published: 1 July 1990
PDF: 13 pages
Proc. SPIE 1243, Electron Image Tubes and Image Intensifiers, (1 July 1990); doi: 10.1117/12.19475
Show Author Affiliations
W. Bruce Feller, Galileo Electro-Optics Corp. (United States)

Published in SPIE Proceedings Vol. 1243:
Electron Image Tubes and Image Intensifiers
Illes P. Csorba, Editor(s)

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