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Proceedings Paper

Proton radiation effects on multi-pinned-phased CCDs
Author(s): Debbie Murata-Seawalt; Jeffrey D. Orbock; Alan W. Delamere; Walter B. Fowler; Morley M. Blouke
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Paper Abstract

Three Tektronix 1024 x 1024 multi-pinned-phased (MPP) charge coupled devices were irradiated with protons to obtain data on CCD performance degradation in a proton radiation environment. The devices were irradiated with a spectrum of energies up to 120 MeV, simulating the total radiation dose of a long-term space experiment. Basic parameters such as charge transfer efficiency, dark current, noise, and full well were measured before and after irradiation. A test was also performed to determine the effectiveness of various thicknesses of tantalum shielding in protecting the CCD from damage. Dark current increase and CTE degradation were the most noticeable effects of proton radiation. This paper will present the objectives, test data, and conclusions of the proton testing, and will identify future testing to be performed.

Paper Details

Date Published: 1 July 1990
PDF: 10 pages
Proc. SPIE 1242, Charge-Coupled Devices and Solid State Optical Sensors, (1 July 1990); doi: 10.1117/12.19458
Show Author Affiliations
Debbie Murata-Seawalt, Ball Aerospace Systems Group (United States)
Jeffrey D. Orbock, Ball Aerospace Systems Group (United States)
Alan W. Delamere, Ball Aerospace Systems Group (United States)
Walter B. Fowler, NASA/Goddard Space Flight Ctr. (United States)
Morley M. Blouke, Tektronix Inc. (United States)

Published in SPIE Proceedings Vol. 1242:
Charge-Coupled Devices and Solid State Optical Sensors
Morley M. Blouke, Editor(s)

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