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Proceedings Paper

Signal-to-noise ratio analysis of charge-coupled device imagers
Author(s): Peter D. Burns
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Paper Details

Date Published: 1 July 1990
PDF: 8 pages
Proc. SPIE 1242, Charge-Coupled Devices and Solid State Optical Sensors, (1 July 1990); doi: 10.1117/12.19454
Show Author Affiliations
Peter D. Burns, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 1242:
Charge-Coupled Devices and Solid State Optical Sensors
Morley M. Blouke, Editor(s)

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