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Proceedings Paper

Signal-to-noise ratio analysis of charge-coupled device imagers
Author(s): Peter D. Burns
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Paper Abstract

We start with a physical model1 of the detector and associated electronics. Using previously derived expressions for the MTF and noise power spectrum, we extend the use of the model to include a signal-to-noise metric, the noise equivalent quanta (NEQ). This approach is then applied in a design example relevant to film and document scanning.

Paper Details

Date Published: 1 July 1990
PDF: 8 pages
Proc. SPIE 1242, Charge-Coupled Devices and Solid State Optical Sensors, (1 July 1990); doi: 10.1117/12.19454
Show Author Affiliations
Peter D. Burns, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 1242:
Charge-Coupled Devices and Solid State Optical Sensors
Morley M. Blouke, Editor(s)

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