Share Email Print
cover

Proceedings Paper

Comprehensive optical diagnostics of IR-sensitive film structures
Author(s): Sergey C. Stafeev
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Principles of the integrated optical noninvasive inspections (or nondestructive testing) of material quality are considered. It's well known that different optical methods allow us to obtain 2-dimensional spatial distributions of parameters most required for tested materials. The aim of this contribution is to elaborate ways of comprehensively using optical techniques (photometry, reflectivity, scattering, interferometry, holography, polarization, luminescence and so on). The special feature of proposed set up is the modular construction and high flexibility in design, i.e., it is possible to adapt our equipment to different kinds of automated testing techniques. Considered methods and set up were applied to the investigation of a wide range of subjects, e.g., solid natural or artificial materials, liquid crystals, microporous or fractal matrix, solutions, and biological specimens. In this paper only the results, concerned with semiconductor wafers or film-structures, are discussed. The experimental verifications and arbitrary electrophysical measurements are included.

Paper Details

Date Published: 15 November 1994
PDF: 6 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194355
Show Author Affiliations
Sergey C. Stafeev, St. Petersburg Institute of Fine Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

© SPIE. Terms of Use
Back to Top