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Proceedings Paper

Monocular parameter estimation from intersections with planar surfaces
Author(s): Rolf Gerdes
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Paper Abstract

Many industrial applications of optical metrology are confined to planar configurations. In this paper an approach to monocular parameter estimation is presented which makes use of this constraint. In addition to the components camera calibration and subpixel edge point detection, the method employs a recursive algorithm for parameter estimation. The algorithm and its application to simple contours such as lines and circles as well as to arbitrary implicitly given functions is described. The paper focuses on the contour segmentation that is reached using a fast plausibility test of the algorithm's residual sequence.

Paper Details

Date Published: 15 November 1994
PDF: 11 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194346
Show Author Affiliations
Rolf Gerdes, Univ.-GH-Siegen (Germany)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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