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Proceedings Paper

Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method
Author(s): Mario Bertolotti; G. L. Liakhou; Roberto Li Voti; Ruo Peng Wang; Concita Sibilia; Vladimir P. Yacovlev
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Paper Abstract

The mirror temperature of diode lasers has been measured by means of a photodeflection method. Information on the thermal behavior of the laser during operation is also obtained.

Paper Details

Date Published: 15 November 1994
PDF: 10 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194337
Show Author Affiliations
Mario Bertolotti, Univ. di Roma La Sapienza and GNEQP of CNR and INFM (Italy)
G. L. Liakhou, Technical Univ. of Moldova (Moldova)
Roberto Li Voti, Univ. di Roma La Sapienza and GNEQP of CNR and INFM (Italy)
Ruo Peng Wang, Peking Univ. (China)
Concita Sibilia, Univ. di Roma La Sapienza and GNEQP of CNR and INFM (Italy)
Vladimir P. Yacovlev, Technical Univ. of Moldova (Moldova)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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