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Proceedings Paper

Analysis of defects in ceramics through photothermal deflection method
Author(s): Mario Bertolotti; M. Firpo; Adriano Fontana; G. L. Liakhou; Roberto Li Voti; Concita Sibilia
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Paper Abstract

A discussion about the photodeflection capability to detect layers and defects is presented. A 1D and 3D numerical analysis has been performed. In particular for the 3D case, a model based on the analog circuit method is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the photothermal deflection method. Experimental results are also discussed.

Paper Details

Date Published: 15 November 1994
PDF: 8 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194330
Show Author Affiliations
Mario Bertolotti, Univ. di Roma La Sapienza (Italy)
M. Firpo, Univ. di Roma La Sapienza (Italy)
Adriano Fontana, Univ. di Roma La Sapienza (Italy)
G. L. Liakhou, Technical Univ. of Moldova (Moldova)
Roberto Li Voti, Univ. di Roma La Sapienza (Italy)
Concita Sibilia, Univ. di Roma La Sapienza (Italy)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries

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