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Proceedings Paper

High-performance mechanically butted 12,000 x 1 pixel VIS/NIR focal-plane array
Author(s): Donna-Lynn Seeley; P. Cheng; Douglas W. Debs; H. Lawler; Shirley S. Ng; R. Sanchez; David D. Wen
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Paper Abstract

The CCD194 image sensor is described in terms of the high-performance, low-light-level, high-resolution applications (graphics, reconnaissance, and photogrammetry) for which it has been designed. The CCD194 design comprises two monolithic 6000 by 1 CCD image sensors in a body consisting of an aluminum header and an antireflective sapphire window. The photosite arrays are butted end-to-end and linearly aligned, separated by a distance of 20 microns. The peak-to-peak nonlinearity and nonplanarity are less than 15 microns for the entire 120-mm photosite span. A distance of 20 microns separates the arrays. The electrical characteristics of the device are tested; photosite transfer loss is measured. The results show a dynamic range of 15,000 to 1 with respect to rms noise, charge transfer inefficiency of 10 to the -6th/transfer, and a photoresponse nonuniformity of 15 percent. The line-scan imager is shown to function in high-performance, high-resolution, low-light-level applications. A 32 MHz effective data rate is provided by dual outputs on four chips.

Paper Details

Date Published: 1 July 1990
PDF: 9 pages
Proc. SPIE 1242, Charge-Coupled Devices and Solid State Optical Sensors, (1 July 1990); doi: 10.1117/12.19433
Show Author Affiliations
Donna-Lynn Seeley, Loral Fairchild Imaging Sensors (United States)
P. Cheng, Loral Fairchild Imaging Sensors (United States)
Douglas W. Debs, Loral Fairchild Imaging Sensors (United States)
H. Lawler, Loral Fairchild Imaging Sensors (United States)
Shirley S. Ng, Loral Fairchild Imaging Sensors (United States)
R. Sanchez, Loral Fairchild Imaging Sensors (United States)
David D. Wen, Loral Fairchild Imaging Sensors (United States)


Published in SPIE Proceedings Vol. 1242:
Charge-Coupled Devices and Solid State Optical Sensors
Morley M. Blouke, Editor(s)

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