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Proceedings Paper

Electronic shearography (ESPSI) for direct measurement of strains
Author(s): Wolfgang Steinchen; Lian Xiang Yang; M. Schuth; Gerhard Kupfer
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Paper Abstract

Holographic interferometry is an optical method for measuring displacement. However, it is the first or second derivative of displacement in many cases that is of interest, rather than the displacement information. Shearography which has developed in the last twelve years permits full-field, noncontacting measurement of the first derivative of displacement, and, therefore, it is rapidly gaining acceptance by the industry. This paper presents the recent development of shearography in technique and in theory. A few applications are shown in this paper.

Paper Details

Date Published: 15 November 1994
PDF: 12 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194322
Show Author Affiliations
Wolfgang Steinchen, Univ.-GH-Kassel (Germany)
Lian Xiang Yang, Univ.-GH-Kassel (Germany)
M. Schuth, Univ.-GH-Kassel (Germany)
Gerhard Kupfer, Univ.-GH-Kassel (Germany)

Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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