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Proceedings Paper

High sensitivity fringe projection micro-shape measurement system
Author(s): Maria Pirga; Malgorzata Kujawinska
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Paper Abstract

The high sensitivity fringe projection automated system for shape measurement of the object with P-V ranging from 10 - 2000 micrometers is presented. The system uses the carrier-frequency phase-shifting fringe pattern analysis method which enables the proper shape determination on the basis of a single image. The system may be applied for the object with max. dimension up to 20 mm. The opto-mechanical arrangement uses white light and is not sensitive for vibrations and work in a hostile environment.

Paper Details

Date Published: 15 November 1994
PDF: 5 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194316
Show Author Affiliations
Maria Pirga, Warsaw Univ. of Technology (Poland)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

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