Share Email Print

Proceedings Paper

High sensitivity fringe projection micro-shape measurement system
Author(s): Maria Pirga; Malgorzata Kujawinska
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The high sensitivity fringe projection automated system for shape measurement of the object with P-V ranging from 10 - 2000 micrometers is presented. The system uses the carrier-frequency phase-shifting fringe pattern analysis method which enables the proper shape determination on the basis of a single image. The system may be applied for the object with max. dimension up to 20 mm. The opto-mechanical arrangement uses white light and is not sensitive for vibrations and work in a hostile environment.

Paper Details

Date Published: 15 November 1994
PDF: 5 pages
Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); doi: 10.1117/12.194316
Show Author Affiliations
Maria Pirga, Warsaw Univ. of Technology (Poland)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 2248:
Optical Measurements and Sensors for the Process Industries
Christophe Gorecki; Richard W. T. Preater, Editor(s)

© SPIE. Terms of Use
Back to Top